Work

Characterization of RF Sputtered-ZnS Thin Film Grown at Various Annealing Temperatures

Year: 2017

Type: article

Source: Journal of Nanoscience and Nanotechnology

DOI: 10.1166/jnn.2017.14273

Authors: Donghyun Hwang, Chang-Sik Son

Institution: Silla University

Language: English

Topic: Chalcogenide Semiconductor Thin Films

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2595884019

FWCI: 0.111

Cites:

Cited by: 1

Related to: 10