Work

Multifunctional Equipment and Test Results for Total Ionizing Dose Testing of Analog Integrated Circuits

Year: 2016

Type: conference-paper

Source: IEEE Radiation Effects Data Workshop (REDW)

DOI: 10.1109/nsrec.2016.7891724

Authors: Alexander S. Bakerenkov, Pavel A. Chubunov, Vasily S. Anashin, Alexander S. Rodin, Vladislav A. Felitsyn

Institutions: National Research Nuclear University MEPhI, Russian Space Systems

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2604539730

FWCI: 0.464

Cites: 2

Cited by: 5

Related to: 10