Experimental decomposition of the positive bias temperature stress‐induced instability in self‐aligned coplanar InGaZnO thin‐film transistors and its modeling based on the multiple stretched‐exponential functions
Year: 2017
Type: article
DOI: 10.1002/jsid.531
Authors: Dae Hwan Kim, Sungju Choi, Juntae Jang, Hara Kang, Dong Myong Kim, Sung‐Jin Choi, Yong‐Sung Kim, Saeroonter Oh, Ju Heyuck Baeck, Jong Uk Bae, Kwon‐Shik Park, Soo Young Yoon, In Byeong Kang
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
Award: G2742038844
OpenAlex ID: W2606606575