Work

Soft-error detection in Register Files using circular scan

Year: 2017

Type: conference-paper

Source: International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS)

DOI: 10.1109/dtis.2017.7930164

Author: Jan Schat

Institution: NXP (Germany)

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2616468442

FWCI:

Cites: 15

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Related to: 10