Work

Direct correlation between low-frequency noise measurements and electromigration lifetimes

Year: 2017

Type: conference-paper

Source: IEEE International Reliability Physics Symposium proceedings

DOI: 10.1109/irps.2017.7936341

Authors: Sofie Beyne, Kristof Croes, Ingrid De Wolf, Zsolt Tokei

Institutions: IMEC, KU Leuven

Language: English

Topic: Copper Interconnects and Reliability

Subfield: Electronic, Optical and Magnetic Materials

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

Funder: Vlaamse regering

OpenAlex ID: W2621292860

FWCI: 6.169

Cites: 23

Cited by: 5

Related to: 10