Work

Evolution of NAND Flash Memory: From 2D to 3D as a Storage Market Leader

Year: 2017

Type: conference-paper

Source: IEEE International Memory Workshop (IMW)

DOI: 10.1109/imw.2017.7939081

Authors: Hyunsuk Kim, Su-Jin Ahn, Yu Gyun Shin, Kyupil Lee, Eunseung Jung

Institution: Samsung Electronics (South Korea)

Language: English

Topic: Advanced Data Storage Technologies

Subfield: Computer Networks and Communications

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2623907268

FWCI: 6.254

Cites: 12

Cited by: 126

Related to: 10