Work

SIS Tunnel Junction’s Specific Capacitance Direct Measurement

Year: 2014

Type: article

Abstract: The need for operating frequencies well into THz region with higher sensitivity and wider bandwidth pushes superconductor-insulator-superconductor (SIS) technology towards junctions with more transparent barrier and higher current densities. Obtaining accurate knowledge of the specific capacitance, which is related to the transparency of the junctions, leads to a precise design of the tuning circuitry. Previously, characterization of the SIS junction’s specific capacitance involved complex measurements providing data relying on various model fitting. Herein, we present the characterization of the specific capacitance by directly measuring the impedance of the SIS tunnel junction at microwave frequencies (~3 GHz).

Source: Chalmers Publication Library (Chalmers University of Technology)

Authors: Parisa Yadranjee Aghdam, Hawal Rashid, Vincent Desmaris, Alexey Pavolotskiy, Victor Belitsky

Language: English

Topic: Superconducting and THz Device Technology

Subfield: Astronomy and Astrophysics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: green

OpenAlex ID: W263773159

FWCI: 0.18

Cites: 9

Cited by: 1

Related to: 10