X-ray emission yields from both surfaces of thin targets bombarded with a 200-MeV H sup minus beam
Year: 1988
Type: article
Abstract: A modified commercial energy-dispersive x-ray spectrometer was used to measure the yields of characteristic x rays from elemental and alloy targets irradiated by a 200-MeV negative-hydrogen beam. In most cases the entry surface, which was bombarded by both electrons and protons, gave about a factor of 2 higher yield than the exit surface where the stripped protons emerged. The results suggest a method of measuring beam profiles where particle densities are too low to be detected electrically by wire arrays. 6 refs., 4 figs.
Authors: P. E. Vanier, Zucker, C.L. Snead
Language: English
Subfield: Computational Mechanics
Field: Engineering
Domain: Physical Sciences
Open Access status: green
OpenAlex ID: W2678382