Work

An Assessment of Long Term Degradation Mechanisms in GaAs MMICs

Year: 1997

Type: article

Authors: Clifford Lindsay, R.F.B. Conlon, P.H. Bolbot, F. Garat, L. Marchand

Language: English

Topic: Integrated Circuits and Semiconductor Failure Analysis

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W26853607

FWCI:

Cites:

Cited by: 1

Related to: 10