Work

TIM, EMMI and 3D TCAD analysis of discrete-technology SCRs

Year: 2017

Type: article

Source: Microelectronics Reliability

DOI: 10.1016/j.microrel.2017.06.070

Authors: C. Fleury, G. Notermans, H.-M. Ritter, D. Pogany

Institution: TU Wien

Language: English

Topic: Electrostatic Discharge in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2731925804

FWCI: 0.335

Cites: 18

Cited by: 5

Related to: 10