Work

Evaluation of Interface State Distributions in LP-CVD SiO 2 /GaN by Deep-Level

Year: 2017

Type: article

Source: The Japan Society of Applied Physics

Authors: Hiroyuki Ueda, Tomohiko Mori, Masato Kodama, Yoshitaka Nagasato, Hidemoto Tomita, Kozo Kato

Language: English

Topic: GaN-based semiconductor devices and materials

Subfield: Condensed Matter Physics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2749855331

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