Fast X-ray reflectivity measurements using an X-ray pixel area detector at the DiffAbs beamline, Synchrotron SOLEIL
Year: 2017
Type: article
Abstract: This paper describes a method for rapid measurements of the specular X-ray reflectivity signal using an area detector and a monochromatic, well collimated X-ray beam (divergence below 0.01°), combined with a continuous data acquisition mode during the angular movements of the sample and detector. In addition to the total integrated (and background-corrected) reflectivity signal, this approach yields a three-dimensional mapping of the reciprocal space in the vicinity of its origin. Grazing-incidence small-angle scattering signals are recorded simultaneously. Measurements up to high momentum transfer values (close to 0.1 nm −1 , also depending on the X-ray beam energy) can be performed in total time ranges as short as 10 s. The measurement time can be reduced by up to 100 times as compared with the classical method using monochromatic X-ray beams, a point detector and rocking scans (integrated reflectivity signal).
Source: Journal of Synchrotron Radiation
Institutions: Synchrotron SOLEIL, Commissariat à l'Énergie Atomique et aux Énergies Alternatives, Institut Rayonnement-Matière de Saclay, CEA Paris-Saclay, Centre National de la Recherche Scientifique, École Nationale Supérieure de Mécanique et d'Aérotechnique, Institut Pprime, Université de Poitiers
Language: English
Subfield: Materials Chemistry
Field: Materials Science
Domain: Physical Sciences
Open Access status: hybrid
Estimated APC paid: $3,180
OpenAlex ID: W2777282949