Work

Reliability analysis of rectification on electromagnetic compatibility test

Year: 2017

Type: conference-paper

DOI: 10.1109/ieem.2017.8290030

Authors: D. Li, W. Dang, L. Sun, Y. Tian, J. Feng

Institutions: Chinese Academy of Sciences, Technology and Engineering Center for Space Utilization

Language: English

Topic: Electromagnetic Compatibility and Noise Suppression

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2785376971

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Cites: 5

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Related to: 10