Effect of electron injection on defect reactions in irradiated silicon containing boron, carbon, and oxygen
Year: 2018
Type: article
Source: Journal of Applied Physics
DOI: 10.1063/1.5010965
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
Funder: CERN
OpenAlex ID: W2790970331
