Work

Investigation of total dose effects in SiGe HBTs under different exposure conditions

Year: 2018

Type: article

Source: Radiation Physics and Chemistry

DOI: 10.1016/j.radphyschem.2018.05.019

Authors: Yabin Sun, Ziyu Liu, Jun Fu, Xiaojin Li, Yanling Shi

Institutions: East China Normal University, City University of Hong Kong, Tsinghua University

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funders: National Natural Science Foundation of China, Science and Technology Commission of Shanghai Municipality

Awards: G2061749428, G5373590898, G8879312725

OpenAlex ID: W2804840231

FWCI: 0.383

Cites: 19

Cited by: 13

Related to: 10