Work

Design Rules to Adapt the Desaturation Detection for SiC MOSFET Modules

Year: 2017

Type: article

Source: ERef Bayreuth (University of Bayreuth)

Authors: Teresa Bertelshofer, Andreas Maerz, Mark‐M. Bakran

Language: English

Topic: Silicon Carbide Semiconductor Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2805477448

FWCI: 1.339

Cites:

Cited by: 23

Related to: 10