Innovative practices on machine learning for emerging applications
Year: 2018
Type: conference-abstract
Source: IEEE VLSI Test Symposium (VTS)
Institutions: Huawei Technologies (United States), Siemens (United States)
Language: English
Topic: Internet of Things and AI
Subfield: Information Systems
Field: Computer Science
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2805962296
