Work

Modeling split-gate flash memory cell for advanced neuromorphic computing

Year: 2018

Type: conference-paper

Source: IEEE International Conference on Microelectronic Test Structures (ICMTS)

DOI: 10.1109/icmts.2018.8383757

Authors: Mandana Tadayoni, Santosh Hariharan, Steven Lemke, Thibaut Pate-Cazal, Bernard Bertello, Vipin Tiwari, Nhan Do

Institution: Microchip Technology (United States)

Language: English

Topic: Advanced Memory and Neural Computing

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2807813675

FWCI: 1.199

Cites: 2

Cited by: 5

Related to: 10