Compensation of Surface Roughness Using an Au Intermediate Layer in a Cu Direct Bonding Process
Year: 2018
Type: article
Source: Journal of Electronic Materials
Language: English
Topic: 3D IC and TSV technologies
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
Awards: G5153014975, G7922344026
OpenAlex ID: W2808033958
