An Under Sampling Scope for Characterization of 42-Gs/s DAC in 28-nm FD-SOI
Year: 2018
Type: article
Institutions: Ciena (Canada), Microsemi (Canada), Dalhousie University
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2808548563
