Work

Improving Quality Control of Mechatronic Systems Using KPI-Based Statistical Process Control

Year: 2018

Type: conference-paper

Source: Advances in intelligent systems and computing

DOI: 10.1007/978-3-319-94196-7_37

Authors: Benedict Wohlers, Stefan Dziwok, David Schmelter, Wadim Lorenz

Institutions: Fraunhofer Institute for Mechatronic Systems Design, Diebold Nixdorf (Germany)

Language: English

Topic: Advanced Statistical Process Monitoring

Subfield: Statistics, Probability and Uncertainty

Field: Decision Sciences

Domain: Social Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W2810735010

FWCI: 0.746

Cites: 7

Cited by: 3

Related to: 10