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Workload-aware failure prediction method for VLSI devices using an LUT based approach

Year: 2018

Type: conference-paper

Source: IEEE International Instrumentation and Measurement Technology Conference

DOI: 10.1109/i2mtc.2018.8409562

Authors: Zhiming Yang, Peng Sun, Yang Yu, Hui Zhang, Guoyu Gao, Xiyuan Peng

Institution: Harbin Institute of Technology

Language: English

Topic: Low-power high-performance VLSI design

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: National Science Foundation

OpenAlex ID: W2866433396

FWCI: 1.599

Cites: 15

Cited by: 7

Related to: 10