Work

Spectroscopic Ellipsometry and Optical Dispersion Analysis of Nanocrystalline CdS Thin Films

Year: 2018

Type: article

Source: Transactions on Electrical and Electronic Materials

DOI: 10.1007/s42341-018-0059-z

Author: Wug-Dong Park

Institution: Dongyang University

Language: English

Topic: Chalcogenide Semiconductor Thin Films

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funders: Korea Basic Science Institute, National NanoFab Center

OpenAlex ID: W2883554600

FWCI:

Cites: 24

Cited by: 2

Related to: 10