Localization of dielectric breakdown defects in multilayer ceramic capacitors using 3D X-ray imaging
Year: 2018
Type: article
Authors: J.M. Ingman, J.P.A. Jormanainen, A.M. Vulli, J.D. Ingman, K. Maula, T.J. Kärkkäinen, P. Silventoinen
Institutions: ABB (Finland), Lappeenranta-Lahti University of Technology
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2898695753