A 224 PW 260 PPM/°C Gate-Leakage-Based Timer for Ultra-Low Power Sensor Nodes with Second-Order Temperature Dependency Cancellation
Year: 2018
Type: conference-paper
Source: Symposium on VLSI Circuits
Authors: Jongyup Lim, Taekwang Jang, Mehdi Saligane, Makoto Yasuda, Satoru Miyoshi, Masaru Kawaminami, David Blaauw, Dennis Sylvester
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2898745153
