Work

Flash memory reliability

Year: 1998

Type: article

Source: Microelectronics Reliability

DOI: 10.1016/s0026-2714(97)00048-6

Author: P Cappelletti

Language: English

Topic: Semiconductor materials and devices

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2899062452

FWCI: 1.419

Cites: 8

Cited by: 23

Related to: 10