Work

All-Electronic High-Resolution Terahertz Thickness Measurements

Year: 2018

Type: conference-paper

Source: International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz)

DOI: 10.1109/irmmw-thz.2018.8510060

Authors: Nina S. Schreiner, Wolfgang Sauer-Greff, Ralph Urbansky, Fabian Friedcrich

Institutions: Fraunhofer Institute for Industrial Mathematics, University of Kaiserslautern

Language: English

Topic: Terahertz technology and applications

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2899208652

FWCI: 1.196

Cites: 5

Cited by: 5

Related to: 10