Work

Accumulated Aggregation Shifting Based on Feature Enhancement for Defect Detection on 3D Textured Low-Contrast Surfaces

Year: 2018

Type: conference-paper

Source: Proceedings - International Conference on Pattern Recognition/Proceedings/International Conference on Pattern Recognition

DOI: 10.1109/icpr.2018.8545501

Authors: Yaping Yan, Sheng Xiang, Hirokazu Asano, Shun'ichi Kaneko

Institution: Hokkaido University

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2903396697

FWCI: 1.25

Cites: 14

Cited by: 3

Related to: 10