Work

Optical and electrical characterization of deep traps in erbium doped silicon

Year: 2017

Type: book-chapter

Source: Routledge eBooks

DOI: 10.1201/9781315140810-60

Authors: A. Castaldini, A. Cavallini, B. Fraboni, S. Binetti, M. Donghi, S. Pizzini, G. Wagner

Language: English

Topic: Semiconductor materials and interfaces

Subfield: Electronic, Optical and Magnetic Materials

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2904763590

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Cites: 1

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Related to: 10