Work

Closest Fit Approach for Pattern Designing to Recovered Anomalous Values in Data Mining

Year: 2018

Type: conference-paper

Source: World Conference on Smart Trends in Systems, Security and Sustainability (WorldS4)

DOI: 10.1109/worlds4.2018.8611610

Authors: Sanjay Gaur, Darshanaben Dipakkumar Pandya

Institution: Madhav University

Language: English

Topic: Anomaly Detection Techniques and Applications

Subfield: Artificial Intelligence

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2913654181

FWCI: 0.089

Cites: 9

Cited by: 10

Related to: 10