Work

Microwave Ellipsometry Characterization of Isotropic Materials Using Simulated Annealing Combined With Levenberg-marquardt Algorithm.

Year: 2019

Type: article

Abstract: The characterization of thick materials using microwave ellipsometry is known as non destructive technic. New microwave Ellipsometry has been developed and tested at different frequencies: in the 24-40

Source: International Journal of Advanced Research

DOI: 10.21474/ijar01/8413

Authors: A Moungache, B Bayard, S Robert

Institutions: University of N'Djamena, Centre National de la Recherche Scientifique, Laboratoire Hubert Curien, Université Jean Monnet, Université Jean Monnet

Language: English

Topic: Microwave and Dielectric Measurement Techniques

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: hybrid

OpenAlex ID: W2913990767

FWCI: 0.09

Cites: 9

Cited by: 1

Related to: 10