Surface oxidation model in plasma enhanced atomic layer deposition for silicon oxide films including various aminosilane precursors
Year: 2019
Type: article
DOI: 10.1116/1.5078537
Institution: Tokyo Electron Technology Solutions Limited (Japan)
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2914402011
