Work

Charge effects in dielectric films of MIS structures being under high-field injection of electrons at ionizing radiation

Year: 2019

Type: conference-paper

Source: International Conference on Micro- and Nano-Electronics (ICMNE)

DOI: 10.1117/12.2521985

Authors: Vladimir M. Maslovsky, Dmitrii V. Andreev, Alexander A. Stolyarov, Vladimir V. Andreev

Institutions: Moscow Institute of Physics and Technology, Bauman Moscow State Technical University

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2921749366

FWCI: 1.584

Cites: 21

Cited by: 10

Related to: 10