Application of Synchrotron Radiation Excited X-Ray Fluorescence Analysis to Micro and Trace Element Determination
Year: 1985
Type: article
Source: Advances in X-ray Analysis
Authors: Atsuo lida, Yohichi Gohshi, Hideki Maezawa
Institutions: The University of Tokyo, Photon Factory
Language: English
Subfield: Radiation
Field: Physics and Astronomy
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2933088043