Work

Growth and Characterization of Tin Sulphide Nanostructured Thin Film by Chemical Bath Deposition for Near-Infrared Photodetector Application

Year: 2019

Type: article

Source: Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena

DOI: 10.4028/www.scientific.net/ssp.290.220

Authors: Mohamed S. Mahdi, Kamarulazizi Ibrahim, Naser Mahmoud Ahmed, Arshad Hmood, Shrook A. Azzez

Institutions: Universiti Sains Malaysia, Universiti Teknologi MARA, University of Basrah

Language: English

Topic: Chalcogenide Semiconductor Thin Films

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: Universiti Sains Malaysia

OpenAlex ID: W2941706396

FWCI: 0.722

Cites: 6

Cited by: 16

Related to: 10