Work

Performance Evaluation of Submicron SiC MESFET

Year: 2018

Type: conference-paper

Source: International Electrical Engineering Congress (iEECON)

DOI: 10.1109/ieecon.2018.8712187

Authors: Saif ur Rehman, Hafiz Fuad Usman, Rao Muhammad Asif, Hafiz Muhammad Ashraf

Institutions: Capital University of Science and Technology, Superior University

Language: English

Topic: Silicon Carbide Semiconductor Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2945720595

FWCI:

Cites: 11

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Related to: 10