Work

Comprehensive Reliability Study of STT-MRAM Devices and Chips for Last Level Cache Applications (LLC) at 0x Nodes

Year: 2019

Type: conference-paper

Source: International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA)

DOI: 10.1109/vlsi-tsa.2019.8804693

Authors: Jian Zhu, Yuan-Jen Lee, Huanlong Liu, Son Le, Jodi Iwata-Harms, Sahil Patel, Ru-Ying Tong, Vignesh Sundar, Santiago Serrano-Guisan, Dongna Shen, Renren He, Jesmin Haq, Jeffrey Teng, Vinh Lam, Yi Yang, Yu-Jen Wang, Tom Zhong, Luc Thomas, Hideaki Fukuzawa, Guenole Jan, Po-Kang Wang

Language: English

Topic: Magnetic properties of thin films

Subfield: Condensed Matter Physics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2969769202

FWCI: 0.691

Cites: 1

Cited by: 1

Related to: 10