Work

An Examination of the Crystalline Quality of 200mm Diameter Silicon Substrates using X-ray Topography

Year: 1997

Type: article

Source: MRS Proceedings

DOI: 10.1557/proc-469-83

Authors: J. Curley, P. J. McNally, A. Reader, T. Tuomi, M. Taskinen, R. Rantamäki, A. Danilewsky, B. Schropp

Institutions: Dublin City University, Philips (France), University of Freiburg

Language: English

Topic: Silicon and Solar Cell Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: Deutsches Elektronen-Synchrotron

OpenAlex ID: W2978281317

FWCI: 0.502

Cites: 10

Cited by: 1

Related to: 10