Quantitative analysis on the microstructure of molten binary KF‐AlF3 system by in situ Raman spectroscopy assisted with first principles method
Year: 2019
Type: article
Source: Journal of Raman Spectroscopy
DOI: 10.1002/jrs.5751
Language: English
Subfield: Electrochemistry
Field: Chemistry
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2986778298
