Work

MOM Capacitance Characterization in G-Band using On-wafer 3D-TRL Calibration

Year: 2019

Type: conference-paper

Source: European Microwave Integrated Circuits Conference

DOI: 10.23919/eumic.2019.8909558

Authors: A.A. Saadi, M. Margalef, S. Le Pilliet, C. Gaquiere, D. Gloria, C. Durand, P. Ferrari

Institutions: Institut polytechnique de Grenoble, Centre National de la Recherche Scientifique, Université Grenoble Alpes, Université de Lille, Institut d'Electronique, de Microélectronique et de Nanotechnologie, STMicroelectronics (France)

Language: English

Topic: Microwave and Dielectric Measurement Techniques

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2990250536

FWCI: 1.185

Cites: 7

Cited by: 5

Related to: 10