Work

Novel on-resistance based methodology for MOSFET electrical characterization

Year: 2019

Type: article

Source: Solid-State Electronics

DOI: 10.1016/j.sse.2019.107722

Authors: T.A. Karatsori, K. Bennamane, G. Ghibaudo

Institutions: Institut polytechnique de Grenoble, Institut de Microélectronique, Electromagnétisme et Photonique, Institut Néel, Centre de Radiofréquences, Optique et Micro-nanoélectronique des Alpes, Mouloud Mammeri University of Tizi-Ouzou

Language: English

Topic: Advancements in Semiconductor Devices and Circuit Design

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: bronze

Funder: European Commission

Award: 3D Multi-Process Sequential Integration for Smart Sensor Interfaces

OpenAlex ID: W2991366434

FWCI: 0.09

Cites: 15

Cited by: 2

Related to: 10