Work

Analysis of single event effects in multifunctional CMOS APSs

Year: 2018

Type: conference-paper

Source: International Conference on Radiation Effects of Electronic Devices (ICREED)

DOI: 10.1109/icreed.2018.8905051

Authors: Liu Liyan, Zhu Qingwei, Dong Shan, Wang Liang, Zhao Yuanfu

Institution: Beijing Microelectronics Technology Institute

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2991453685

FWCI:

Cites: 3

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Related to: 10