Work

Ion Beam Analysis of Thin Films on Silicon and Carbon Substrates

Year: 2007

Type: conference-abstract

Source: APS Texas Sections Fall Meeting Abstracts

Authors: Pelham Keahey, J'nae Zwaschka, Lucas Phinney, Lee J. Mitchell, Khalid Hossian, Jerome L. Duggan

Language: English

Topic: Ion-surface interactions and analysis

Subfield: Computational Mechanics

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2996648331

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