Work

An approach for failure prediction in H3 TRB-tests

Year: 2019

Type: conference-paper

Source: European Microelectronics and Packaging Conference

DOI: 10.23919/empc44848.2019.8951836

Authors: Elisabeth Kolbinger, Felix Wuest, Marius van Dijk, Stefan Trampert, Klaus-Dieter Lang

Institutions: Fraunhofer Institute for Reliability and Microintegration, Technische Universität Berlin

Language: English

Topic: Silicon Carbide Semiconductor Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

SDGs: Affordable and clean energy, Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W3000595605

FWCI: 1.185

Cites: 7

Cited by: 5

Related to: 10