Quantitative thermal measurement by the use of scanning thermal microscope and resistive thermal probes
Year: 2020
Type: article
Source: Journal of Applied Physics
DOI: 10.1063/1.5125062
Institution: Silesian University of Technology
Language: English
Subfield: Materials Chemistry
Field: Materials Science
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W3000609494
