Change-point detection of failure mechanism for electronic devices based on Arrhenius model
Work
Year: 2020
Type: article
Source: Applied Mathematical Modelling
Authors Jialu Li, Yubin Tian, Dianpeng Wang
Institution Beijing Institute of Technology
Cites: 17
Cited by: 16
Related to: 10
FWCI: 1.721
Citation percentile (by year/subfield): 85.4
Subfield: Statistics, Probability and Uncertainty
Field: Decision Sciences
Domain: Social Sciences
Sustainable Development Goal Responsible consumption and production
Open Access status: bronze