Work

Design and Verification of ECC Scheme to optimize area and tester time in OTP ROM Controller

Year: 2019

Type: conference-paper

Source: International Conference on Recent Trends on Electronics, Information, Communication & Technology (RTEICT)

DOI: 10.1109/rteict46194.2019.9016746

Authors: H Divva, Arunkumar P Chavan, Shubha Krishnamurthy

Institution: R.V. College of Engineering

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W3010363380

FWCI: 0.796

Cites: 6

Cited by: 6

Related to: 10