Evolution of implicate order from amorphous to polycrystalline Sn-doped In2O3 films determined by in situ two-dimensional X-ray diffraction measurements
Year: 2020
Type: article
Source: Applied Physics Express
Authors: Yutaka Furubayashi, Shintaro Kobayashi, Makoto Maehara, Kazuhiko Ishikawa, Katsuhiko Inaba, Toshiyuki Sakemi, Hisashi Kitami, Tetsuya Yamamoto
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W3018489727