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Advances in Charge-Compensation in Secondary Ion Mass Spectrometry (SIMS)

Year: 2012

Type: article

Source: AGUFM

Authors: R. L. Hervig, J. Chen, S. N. Schauer, B. D. Stanley, Gordon Moore, K. Roggensack

Language: English

Topic: Ion-surface interactions and analysis

Subfield: Surfaces, Coatings and Films

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W3023316342

FWCI:

Cites:

Cited by: 2

Related to: 10