Work

Diffraction Contrast of Small Vacancy Clusters in Silicon

Year: 1970

Type: article

Source: Proceedings annual meeting Electron Microscopy Society of America

DOI: 10.1017/s0424820100069569

Authors: T. J. Magee, R. H. Morriss

Language: English

Topic: Advanced Electron Microscopy Techniques and Applications

Subfield: Structural Biology

Field: Biochemistry, Genetics and Molecular Biology

Domain: Life Sciences

Open Access status: closed

OpenAlex ID: W3036637185

FWCI:

Cites: 3

Cited by: 1

Related to: 10